Patent Examination Summit | Thank you for joining us

We would like to thank you for taking the time out of your busy schedule to attend and participate in the inaugural Summit on Patent Examination in Africa. Your input during the presentations and discussion sessions was of great value and relevance.

We hope that the contacts made at the Summit will be the source of long-term collaboration, and we look forward to welcoming you at the next Patent event soon. Our gratitude is also extended to the European Patent Office (EPO) for their support of the meeting.

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To access photo galleries of the meeting and to download copies of selected presentation files, scroll down. To view the report and gallery from the Africa Network Meeting on 14 & 15 Sept, CLICK HERE.

SELECTED PRESENTATIONS AVAILABLE FOR DOWNLOAD

AFRICA PATENT SUMMIT | GALLERY

AFRICA IP NETWORK FUNCTION | GALLERY